Quantitative magnetic force microscopy on perpendicularly magnetised samples

Hans J. Hug, B. Stiefel, P.J.A. van Schendel, A. Moser, R. Hofer, S. Martin, H.J. Guntherodt, S. Porthun, Leon Abelmann, J.C. Lodder, Gabriel Bochi, R.C. O'Handley

    Research output: Contribution to journalArticleAcademicpeer-review

    124 Citations (Scopus)
    72 Downloads (Pure)

    Abstract

    We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.
    Original languageEnglish
    Pages (from-to)5609-5620
    Number of pages12
    JournalJournal of Applied Physics
    Volume83
    Issue number11
    DOIs
    Publication statusPublished - 1998

    Keywords

    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • SMI-TST: From 2006 in EWI-TST

    Fingerprint Dive into the research topics of 'Quantitative magnetic force microscopy on perpendicularly magnetised samples'. Together they form a unique fingerprint.

    Cite this