Quantitative magnetic force microscopy on perpendicularly magnetised samples

Hans J. Hug; B. Stiefel; P.J.A. van Schendel; A. Moser; R. Hofer; S. Martin; H.J. Guntherodt; S. Porthun; Leon Abelmann; J.C. Lodder; Gabriel Bochi; R.C. O'Handley

doi:10.1063/1.367412

Quantitative magnetic force microscopy on perpendicularly magnetised samples

Hans J. Hug, B. Stiefel, P.J.A. van Schendel, A. Moser, R. Hofer, S. Martin, H.J. Guntherodt, S. Porthun, Leon Abelmann, J.C. Lodder, Gabriel Bochi, R.C. O'Handley

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Abstract

We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.

Original language	English
Pages (from-to)	5609-5620
Number of pages	12
Journal	Journal of Applied Physics
Volume	83
Issue number	11
DOIs	https://doi.org/10.1063/1.367412
Publication status	Published - 1998

Keywords

SMI-EXP: EXPERIMENTAL TECHNIQUES
SMI-TST: From 2006 in EWI-TST

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10.1063/1.367412

Hug1998quantitativeFinal published version, 1.18 MB

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@article{f259125c3bf14b5fa8abd4d1ac7fbecd,

title = "Quantitative magnetic force microscopy on perpendicularly magnetised samples",

abstract = "We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.",

keywords = "SMI-EXP: EXPERIMENTAL TECHNIQUES, SMI-TST: From 2006 in EWI-TST",

author = "Hug, {Hans J.} and B. Stiefel and {van Schendel}, P.J.A. and A. Moser and R. Hofer and S. Martin and H.J. Guntherodt and S. Porthun and Leon Abelmann and J.C. Lodder and Gabriel Bochi and R.C. O'Handley",

note = "Imported from SMI Reference manager",

year = "1998",

doi = "10.1063/1.367412",

language = "English",

volume = "83",

pages = "5609--5620",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "11",

}

TY - JOUR

T1 - Quantitative magnetic force microscopy on perpendicularly magnetised samples

AU - Hug, Hans J.

AU - Stiefel, B.

AU - van Schendel, P.J.A.

AU - Moser, A.

AU - Hofer, R.

AU - Martin, S.

AU - Guntherodt, H.J.

AU - Porthun, S.

AU - Abelmann, Leon

AU - Lodder, J.C.

AU - Bochi, Gabriel

AU - O'Handley, R.C.

N1 - Imported from SMI Reference manager

PY - 1998

Y1 - 1998

N2 - We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.

AB - We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1063/1.367412

DO - 10.1063/1.367412

M3 - Article

VL - 83

SP - 5609

EP - 5620

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 11

ER -

Quantitative magnetic force microscopy on perpendicularly magnetised samples

Abstract

Keywords

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