Quantitative nanoscale surface voltage measurement on organic semiconductor blends

Alexandre Cuenat; Andrés Mũiz-Piniella; Miguel Mũoz-Rojo; Wing C. Tsoi; Craig E. Murphy

doi:10.1088/0957-4484/23/4/045703

Quantitative nanoscale surface voltage measurement on organic semiconductor blends

Alexandre Cuenat^* (Corresponding Author), Andrés Mũiz-Piniella, Miguel Mũoz-Rojo, Wing C. Tsoi, Craig E. Murphy

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

10 Citations (Scopus)

Abstract

We report on the validation of a method based on Kelvin probe force microscopy (KPFM) able to measure the different phases and the relative work function of polymer blend heterojunctions at the nanoscale. The method does not necessitate complex ultra-high vacuum setup. The quantitative information that can be extracted from the topography and the Kelvin probe measurements is critically analysed. Surface voltage difference can be observed at the nanoscale on poly(3-hexyl-thiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) blends and dependence on the annealing condition and the regio-regularity of P3HT is observed.

Original language	English
Article number	045703
Journal	Nanotechnology
Volume	23
Issue number	4
DOIs	https://doi.org/10.1088/0957-4484/23/4/045703
Publication status	Published - 3 Feb 2012
Externally published	Yes

Access to Document

10.1088/0957-4484/23/4/045703

Cite this

@article{924ac4edeb0242739509b0635ae19612,

title = "Quantitative nanoscale surface voltage measurement on organic semiconductor blends",

abstract = "We report on the validation of a method based on Kelvin probe force microscopy (KPFM) able to measure the different phases and the relative work function of polymer blend heterojunctions at the nanoscale. The method does not necessitate complex ultra-high vacuum setup. The quantitative information that can be extracted from the topography and the Kelvin probe measurements is critically analysed. Surface voltage difference can be observed at the nanoscale on poly(3-hexyl-thiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) blends and dependence on the annealing condition and the regio-regularity of P3HT is observed.",

author = "Alexandre Cuenat and Andr{\'e}s Mũiz-Piniella and Miguel Mũoz-Rojo and Tsoi, {Wing C.} and Murphy, {Craig E.}",

year = "2012",

month = feb,

day = "3",

doi = "10.1088/0957-4484/23/4/045703",

language = "English",

volume = "23",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "Institute of Physics (IOP)",

number = "4",

}

TY - JOUR

T1 - Quantitative nanoscale surface voltage measurement on organic semiconductor blends

AU - Cuenat, Alexandre

AU - Mũiz-Piniella, Andrés

AU - Mũoz-Rojo, Miguel

AU - Tsoi, Wing C.

AU - Murphy, Craig E.

PY - 2012/2/3

Y1 - 2012/2/3

N2 - We report on the validation of a method based on Kelvin probe force microscopy (KPFM) able to measure the different phases and the relative work function of polymer blend heterojunctions at the nanoscale. The method does not necessitate complex ultra-high vacuum setup. The quantitative information that can be extracted from the topography and the Kelvin probe measurements is critically analysed. Surface voltage difference can be observed at the nanoscale on poly(3-hexyl-thiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) blends and dependence on the annealing condition and the regio-regularity of P3HT is observed.

AB - We report on the validation of a method based on Kelvin probe force microscopy (KPFM) able to measure the different phases and the relative work function of polymer blend heterojunctions at the nanoscale. The method does not necessitate complex ultra-high vacuum setup. The quantitative information that can be extracted from the topography and the Kelvin probe measurements is critically analysed. Surface voltage difference can be observed at the nanoscale on poly(3-hexyl-thiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) blends and dependence on the annealing condition and the regio-regularity of P3HT is observed.

UR - http://www.scopus.com/inward/record.url?scp=84855573344&partnerID=8YFLogxK

U2 - 10.1088/0957-4484/23/4/045703

DO - 10.1088/0957-4484/23/4/045703

M3 - Article

AN - SCOPUS:84855573344

SN - 0957-4484

VL - 23

JO - Nanotechnology

JF - Nanotechnology

IS - 4

M1 - 045703

ER -

Quantitative nanoscale surface voltage measurement on organic semiconductor blends

Abstract

Access to Document

Other files and links

Fingerprint

Cite this