Quasi interference of perpendicularly polarized guided modes observed with a photon scanning tunneling microscope

M.L.M. Balistreri; A. Driessen; Jeroen P. Korterik; L. Kuipers; N.F. van Hulst

doi:10.1364/OL.25.000637

Quasi interference of perpendicularly polarized guided modes observed with a photon scanning tunneling microscope

M.L.M. Balistreri, A. Driessen, Jeroen P. Korterik, L. Kuipers, N.F. van Hulst

Optical Sciences

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Abstract

The simultaneous detection of TE- as well as TM-polarized light with a photon scanning tunneling microscope leads to a quasi- interference pattern of these mutually perpendicular polarized fields. This interference pattern has been observed in the optical field distribution as a function of both position and wavelength. Comparison of experimental data with simulations confirms the interference of mutually orthogonal fields. This quasi interference is caused by conversion of the linearly polarized light of both modes into elliptically polarized light by a fiber probe. (C) 2000 Optical Society of America.

Original language	Undefined
Pages (from-to)	637-639
Number of pages	3
Journal	Optics letters
Volume	25
Issue number	9
DOIs	https://doi.org/10.1364/OL.25.000637
Publication status	Published - 2000

Keywords

IR-23847
METIS-128646

Access to Document

10.1364/OL.25.000637

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Cite this

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title = "Quasi interference of perpendicularly polarized guided modes observed with a photon scanning tunneling microscope",

abstract = "The simultaneous detection of TE- as well as TM-polarized light with a photon scanning tunneling microscope leads to a quasi- interference pattern of these mutually perpendicular polarized fields. This interference pattern has been observed in the optical field distribution as a function of both position and wavelength. Comparison of experimental data with simulations confirms the interference of mutually orthogonal fields. This quasi interference is caused by conversion of the linearly polarized light of both modes into elliptically polarized light by a fiber probe. (C) 2000 Optical Society of America.",

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author = "M.L.M. Balistreri and A. Driessen and Korterik, {Jeroen P.} and L. Kuipers and {van Hulst}, N.F.",

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pages = "637--639",

journal = "Optics letters",

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T1 - Quasi interference of perpendicularly polarized guided modes observed with a photon scanning tunneling microscope

AU - Balistreri, M.L.M.

AU - Driessen, A.

AU - Korterik, Jeroen P.

AU - Kuipers, L.

AU - van Hulst, N.F.

PY - 2000

Y1 - 2000

N2 - The simultaneous detection of TE- as well as TM-polarized light with a photon scanning tunneling microscope leads to a quasi- interference pattern of these mutually perpendicular polarized fields. This interference pattern has been observed in the optical field distribution as a function of both position and wavelength. Comparison of experimental data with simulations confirms the interference of mutually orthogonal fields. This quasi interference is caused by conversion of the linearly polarized light of both modes into elliptically polarized light by a fiber probe. (C) 2000 Optical Society of America.

AB - The simultaneous detection of TE- as well as TM-polarized light with a photon scanning tunneling microscope leads to a quasi- interference pattern of these mutually perpendicular polarized fields. This interference pattern has been observed in the optical field distribution as a function of both position and wavelength. Comparison of experimental data with simulations confirms the interference of mutually orthogonal fields. This quasi interference is caused by conversion of the linearly polarized light of both modes into elliptically polarized light by a fiber probe. (C) 2000 Optical Society of America.

KW - IR-23847

KW - METIS-128646

U2 - 10.1364/OL.25.000637

DO - 10.1364/OL.25.000637

M3 - Article

SN - 0146-9592

VL - 25

SP - 637

EP - 639

JO - Optics letters

JF - Optics letters

IS - 9

ER -