Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

O.J. Luiten; H.L. van Lieshout; F.A. Michels; P. Valko; M.P. Bruijn; F. Kiewiet; D.J. Adelerhof; A.W. Hamster; G.C.S. Brons; J. Flokstra

doi:10.1016/0168-9002(95)01052-1

Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

O.J. Luiten (Corresponding Author), H.L. van Lieshout, F.A. Michels, P. Valko, M.P. Bruijn, F. Kiewiet, D.J. Adelerhof, A.W. Hamster, G.C.S. Brons, J. Flokstra

Faculty of Science and Technology

Research output: Contribution to journal › Article › Academic

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Abstract

The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

Original language	English
Pages (from-to)	72-74
Journal	Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment
Volume	370
Issue number	1
DOIs	https://doi.org/10.1016/0168-9002(95)01052-1
Publication status	Published - 1996

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Luiten, O. J., van Lieshout, H. L., Michels, F. A., Valko, P., Bruijn, M. P., Kiewiet, F., ... Flokstra, J. (1996). Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 370(1), 72-74. https://doi.org/10.1016/0168-9002(95)01052-1

Luiten, O.J. ; van Lieshout, H.L. ; Michels, F.A. ; Valko, P. ; Bruijn, M.P. ; Kiewiet, F. ; Adelerhof, D.J. ; Hamster, A.W. ; Brons, G.C.S. ; Flokstra, J. / Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. In: Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 1996 ; Vol. 370, No. 1. pp. 72-74.

@article{eb3f9b6d3f5a439197cf400c11713280,

title = "Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy",

abstract = "The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.",

author = "O.J. Luiten and {van Lieshout}, H.L. and F.A. Michels and P. Valko and M.P. Bruijn and F. Kiewiet and D.J. Adelerhof and A.W. Hamster and G.C.S. Brons and J. Flokstra",

year = "1996",

doi = "10.1016/0168-9002(95)01052-1",

language = "English",

volume = "370",

pages = "72--74",

journal = "Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment",

issn = "0168-9002",

publisher = "Elsevier",

number = "1",

}

Luiten, OJ, van Lieshout, HL, Michels, FA, Valko, P, Bruijn, MP, Kiewiet, F, Adelerhof, DJ, Hamster, AW, Brons, GCS & Flokstra, J 1996, 'Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy', Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, vol. 370, no. 1, pp. 72-74. https://doi.org/10.1016/0168-9002(95)01052-1

Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. / Luiten, O.J. (Corresponding Author); van Lieshout, H.L.; Michels, F.A.; Valko, P.; Bruijn, M.P.; Kiewiet, F.; Adelerhof, D.J.; Hamster, A.W.; Brons, G.C.S.; Flokstra, J.

In: Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, Vol. 370, No. 1, 1996, p. 72-74.

Research output: Contribution to journal › Article › Academic

TY - JOUR

T1 - Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

AU - Luiten, O.J.

AU - van Lieshout, H.L.

AU - Michels, F.A.

AU - Valko, P.

AU - Bruijn, M.P.

AU - Kiewiet, F.

AU - Adelerhof, D.J.

AU - Hamster, A.W.

AU - Brons, G.C.S.

AU - Flokstra, J.

PY - 1996

Y1 - 1996

N2 - The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

AB - The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

U2 - 10.1016/0168-9002(95)01052-1

DO - 10.1016/0168-9002(95)01052-1

M3 - Article

VL - 370

SP - 72

EP - 74

JO - Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment

JF - Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment

SN - 0168-9002

IS - 1

ER -

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10.1016/0168-9002(95)01052-1

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