Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

O.J. Luiten (Corresponding Author), H.L. van Lieshout, F.A. Michels, P. Valko, M.P. Bruijn, F. Kiewiet, D.J. Adelerhof, A.W. Hamster, G.C.S. Brons, J. Flokstra

Research output: Contribution to journalArticleAcademic

7 Citations (Scopus)
36 Downloads (Pure)

Abstract

The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

Fingerprint

X ray spectroscopy
X rays
life (durability)
Tunnel junctions
spectroscopy
Analytical models
Tunnels
x rays
tunnel junctions
quantitative analysis
Electrodes
tunnels
counters
Chemical analysis
electrodes
high resolution
energy

Cite this

Luiten, O.J. ; van Lieshout, H.L. ; Michels, F.A. ; Valko, P. ; Bruijn, M.P. ; Kiewiet, F. ; Adelerhof, D.J. ; Hamster, A.W. ; Brons, G.C.S. ; Flokstra, J. / Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. In: Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 1996 ; Vol. 370, No. 1. pp. 72-74.
@article{eb3f9b6d3f5a439197cf400c11713280,
title = "Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy",
abstract = "The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.",
author = "O.J. Luiten and {van Lieshout}, H.L. and F.A. Michels and P. Valko and M.P. Bruijn and F. Kiewiet and D.J. Adelerhof and A.W. Hamster and G.C.S. Brons and J. Flokstra",
year = "1996",
doi = "10.1016/0168-9002(95)01052-1",
language = "English",
volume = "370",
pages = "72--74",
journal = "Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment",
issn = "0168-9002",
publisher = "Elsevier",
number = "1",

}

Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy. / Luiten, O.J. (Corresponding Author); van Lieshout, H.L.; Michels, F.A.; Valko, P.; Bruijn, M.P.; Kiewiet, F.; Adelerhof, D.J.; Hamster, A.W.; Brons, G.C.S.; Flokstra, J.

In: Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, Vol. 370, No. 1, 1996, p. 72-74.

Research output: Contribution to journalArticleAcademic

TY - JOUR

T1 - Quasiparticle lifetimes and tunneltimes in SIS junctions for X-ray spectroscopy

AU - Luiten, O.J.

AU - van Lieshout, H.L.

AU - Michels, F.A.

AU - Valko, P.

AU - Bruijn, M.P.

AU - Kiewiet, F.

AU - Adelerhof, D.J.

AU - Hamster, A.W.

AU - Brons, G.C.S.

AU - Flokstra, J.

PY - 1996

Y1 - 1996

N2 - The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

AB - The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions are essential parameters in the development of these devices for high resolution X-ray spectroscopy. We present a simple analytical model which allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous measurement of both the total charge and the risetime thus becomes a useful diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by variations in the thickness of the counter electrode.

U2 - 10.1016/0168-9002(95)01052-1

DO - 10.1016/0168-9002(95)01052-1

M3 - Article

VL - 370

SP - 72

EP - 74

JO - Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment

JF - Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment

SN - 0168-9002

IS - 1

ER -