Radiated Electromagnetic Fields of Actual Devices Measured in Different Test Environments

Frank Bernardus Johannes Leferink, G. Hilverda, D.J. Groot Boerle, Wim van Etten

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	IEEE Symposium on Electromagnetic Compatibility 2003
Place of Publication	Boston, USA
Pages	558-563
Number of pages	6
Publication status	Published - 18 Aug 2003

Keywords

@inproceedings{d618954e3e954a5d8fcc740ee551c363,

title = "Radiated Electromagnetic Fields of Actual Devices Measured in Different Test Environments",

keywords = "METIS-213656",

author = "Leferink, {Frank Bernardus Johannes} and G. Hilverda and {Groot Boerle}, D.J. and {van Etten}, Wim",

year = "2003",

month = aug,

day = "18",

language = "Undefined",

isbn = "0-7803-7835-0",

pages = "558--563",

booktitle = "IEEE Symposium on Electromagnetic Compatibility 2003",

}

IEEE Symposium on Electromagnetic Compatibility 2003. Boston, USA, 2003. p. 558-563.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Radiated Electromagnetic Fields of Actual Devices Measured in Different Test Environments

AU - Leferink, Frank Bernardus Johannes

AU - Hilverda, G.

AU - Groot Boerle, D.J.

AU - van Etten, Wim

PY - 2003/8/18

Y1 - 2003/8/18

KW - METIS-213656

M3 - Conference contribution

SN - 0-7803-7835-0

SP - 558

EP - 563

BT - IEEE Symposium on Electromagnetic Compatibility 2003

CY - Boston, USA

ER -