Radiated Electromagnetic Fields of Actual Devices Measured in Different Test Environments

Frank Bernardus Johannes Leferink, G. Hilverda, D.J. Groot Boerle, Wim van Etten

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    Original languageUndefined
    Title of host publicationIEEE Symposium on Electromagnetic Compatibility 2003
    Place of PublicationBoston, USA
    Number of pages6
    Publication statusPublished - 18 Aug 2003


    • METIS-213656

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