Radiation pressure sensor

  • M. Karuza*
  • , D. Bozicevic
  • , G. Cantatore
  • , M. Vretenar
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Mechanical elements with dimensions in the nanometer range, at least in one direction, have been successfully employed as sensors in various devices. Their mechanical properties must be known with maximum precision in order to quantify the sensor response to external excitation. This often poses a significant challenge due to the mechanical fragility of the sensor elements. Here we present a measurement of the mechanical response of a 100 nm thick silicon nitride membrane. The external excitation force is provided by a laser beam modulated in amplitude, while the displacement of the membrane is measured by a Michelson interferometer with a homodyne readout.

Original languageEnglish
Title of host publication2020 43rd International Convention on Information, Communication and Electronic Technology, MIPRO 2020 - Proceedings
EditorsMarko Koricic, Karolj Skala, Zeljka Car, Marina Cicin-Sain, Vlado Sruk, Dejan Skvorc, Slobodan Ribaric, Bojan Jerbic, Stjepan Gros, Boris Vrdoljak, Mladen Mauher, Edvard Tijan, Tihomir Katulic, Predrag Pale, Tihana Galinac Grbac, Nikola Filip Fijan, Adrian Boukalov, Dragan Cisic, Vera Gradisnik
PublisherIEEE
Pages1890-1893
Number of pages4
ISBN (Electronic)9789532330991
DOIs
Publication statusPublished - 28 Sept 2020
Event43rd International Convention on Information, Communication and Electronic Technology, MIPRO 2020 - Opatija, Croatia
Duration: 28 Sept 20202 Oct 2020
Conference number: 43

Conference

Conference43rd International Convention on Information, Communication and Electronic Technology, MIPRO 2020
Abbreviated titleMIPRO 2020
Country/TerritoryCroatia
CityOpatija
Period28/09/202/10/20

Keywords

  • Mechanical impedance
  • Mechanical resonator
  • Radiation pressure
  • Sensor
  • 22/2 OA procedure

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