Ramp‐type junction parameter control by Ga doping of PrBa2Cu3O7−δ barriers

M.A.J. Verhoeven, G.J. Gerritsma, H. Rogalla, A.A. Golubov

Research output: Contribution to journalArticleAcademicpeer-review

62 Citations (Scopus)
25 Downloads (Pure)

Abstract

We analyzed the transport of charge carriers across PrBa2Cu3−xGaxO7−δ (PBCGO) barriers as a function of barrier thickness, Ga‐doping level, temperature, and bias voltage. It was found that by Ga doping, the normal state resistance (Rn) of the junctions was systematically increased, while the critical current (Ic) remained constant. We argue that pair transport takes place by direct tunneling, whereas the quasiparticles have access to channels formed by one or more localized states inside the barrier. By Ga doping the IcRn products were increased, up to 8mV at 4.2K for junctions with 8nm thick PrBa2Cu2.6Ga0.4O7−δ barriers.
Original languageEnglish
Pages (from-to)848-850
Number of pages3
JournalApplied physics letters
Volume69
Issue number6
DOIs
Publication statusPublished - 1996

Fingerprint Dive into the research topics of 'Ramp‐type junction parameter control by Ga doping of PrBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> barriers'. Together they form a unique fingerprint.

Cite this