"Random and ordered defects on ion-bombarded Si(100)-(2x1) surfaces"

H. Feil, H. Feil, Henricus J.W. Zandvliet, M.H. Tsai, John D. Dow, I.S.T. Tsong

Research output: Contribution to journalArticleAcademicpeer-review

92 Citations (Scopus)
113 Downloads (Pure)

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