Rapid Transient Fault Insertion in Large Digital Systems

A. Rohani, Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    7 Citations (Scopus)

    Abstract

    This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perform simulation-based fault-injection in complex System-on-Chip Systems (SoCs). The proposed approach can be applied to complex circuits, as it is not required to modify the top-level modules of a design; moreover, it is capable to inject a wide range of fault models in a design and finally a competitive reduction in terms of CPU time will be achieved. The root of our method is based on the usage of simulator-commands along with partial code modification techniques. To prove the efficiency of the proposed method, it has been implemented on two case studies, a pre-synthesized netlist of an AVR microcontroller from ATMEL and a post placed-and-routed Verilog netlist of a high performance reconfigurable processor in 90-nm UMC technology, Xentium processor from Recore Systems. Experimental results show that our technique is able to reduce the CPU time by a factor ranging from 27% to 67% compared with typical simulation-based fault-injection approaches and by a factor of 10% compared with rapid simulation-based techniques.
    Original languageUndefined
    Pages (from-to)147-154
    Number of pages8
    JournalMicroprocessors and microsystems
    Volume37
    Issue number2
    DOIs
    Publication statusPublished - Mar 2013

    Keywords

    • Fault modeling and simulation
    • Transient faults
    • EWI-22292
    • METIS-289705
    • Failure analysis
    • Fault Tolerance
    • Component
    • IR-82118
    • CAES-TDT: Testable Design and Test

    Cite this