Re-using configuration information: High-level diagnosis

R.R. Bakker, P.A. Hogenhuis, Nicolaas Mars, D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageUndefined
    Title of host publicationIndustrial applications of knowledge-based diagnosis
    Place of PublicationAmsterdam
    PublisherElsevier
    Pages3-24
    Number of pages0
    Publication statusPublished - 1992

    Keywords

    • METIS-118943

    Cite this