Re-using configuration information: High-level diagnosis

R.R. Bakker, P.A. Hogenhuis, Nicolaas Mars, D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageUndefined
    Title of host publicationIndustrial applications of knowledge-based diagnosis
    Place of PublicationAmsterdam
    PublisherElsevier
    Pages3-24
    Number of pages0
    Publication statusPublished - 1992

    Keywords

    • METIS-118943

    Cite this

    Bakker, R. R., Hogenhuis, P. A., Mars, N., & van Soest, D. C. (1992). Re-using configuration information: High-level diagnosis. In Industrial applications of knowledge-based diagnosis (pp. 3-24). Amsterdam: Elsevier.
    Bakker, R.R. ; Hogenhuis, P.A. ; Mars, Nicolaas ; van Soest, D.C. / Re-using configuration information: High-level diagnosis. Industrial applications of knowledge-based diagnosis. Amsterdam : Elsevier, 1992. pp. 3-24
    @inbook{bcf2e04027984789b3254421e26bb6cf,
    title = "Re-using configuration information: High-level diagnosis",
    keywords = "METIS-118943",
    author = "R.R. Bakker and P.A. Hogenhuis and Nicolaas Mars and {van Soest}, D.C.",
    year = "1992",
    language = "Undefined",
    pages = "3--24",
    booktitle = "Industrial applications of knowledge-based diagnosis",
    publisher = "Elsevier",

    }

    Bakker, RR, Hogenhuis, PA, Mars, N & van Soest, DC 1992, Re-using configuration information: High-level diagnosis. in Industrial applications of knowledge-based diagnosis. Elsevier, Amsterdam, pp. 3-24.

    Re-using configuration information: High-level diagnosis. / Bakker, R.R.; Hogenhuis, P.A.; Mars, Nicolaas; van Soest, D.C.

    Industrial applications of knowledge-based diagnosis. Amsterdam : Elsevier, 1992. p. 3-24.

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    TY - CHAP

    T1 - Re-using configuration information: High-level diagnosis

    AU - Bakker, R.R.

    AU - Hogenhuis, P.A.

    AU - Mars, Nicolaas

    AU - van Soest, D.C.

    PY - 1992

    Y1 - 1992

    KW - METIS-118943

    M3 - Chapter

    SP - 3

    EP - 24

    BT - Industrial applications of knowledge-based diagnosis

    PB - Elsevier

    CY - Amsterdam

    ER -

    Bakker RR, Hogenhuis PA, Mars N, van Soest DC. Re-using configuration information: High-level diagnosis. In Industrial applications of knowledge-based diagnosis. Amsterdam: Elsevier. 1992. p. 3-24