Re-using configuration information: high-level diagnosis of Philips P9000

R.R. Bakker, P.A. Hogenhuis, Nicolaas Mars, D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationEuropean conference on industrial applications of knowledge-based diagnosis
    Place of PublicationMilaan
    Number of pages19
    Publication statusPublished - 31 Dec 1991


    • METIS-119794

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