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Re-using configuration information: High-level diagnosis

  • R.R. Bakker
  • , P.A. Hogenhuis
  • , Nicolaas Mars
  • , D.C. van Soest

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageUndefined
    Title of host publicationIndustrial applications of knowledge-based diagnosis
    Place of PublicationAmsterdam
    PublisherElsevier
    Pages3-24
    Number of pages0
    Publication statusPublished - 1992

    Keywords

    • METIS-118943

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