Real time adhesion Force imaging in air and liquid with AFM

Kees van der Werf, D.J. van den Heuvel, B.G. de Grooth, Jan Greve

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationRaster-sonden-Mikroskopieen und Organische Materialen IV
    Place of PublicationMunchen
    Publication statusPublished - 31 Oct 1995


    • METIS-130750

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