Real time atomic force microscopy growth monitoring during pulsed laser deposition

W.A. Wessels, Joska Johannes Broekmaat, G.J.C. Baarle, Gertjan Koster, Augustinus J.H.M. Rijnders

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 26 Apr 2013
EventDutch Scanning Probe Microscopy Day 2013 - Eindhoven, Netherlands
Duration: 26 Apr 201326 Apr 2013

Conference

ConferenceDutch Scanning Probe Microscopy Day 2013
Country/TerritoryNetherlands
CityEindhoven
Period26/04/1326/04/13

Keywords

  • METIS-299887

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