Real time atomic force microscopy growth monitoring during pulsed laser deposition

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 26 Apr 2013
EventDutch Scanning Probe Microscopy Day 2013 - Eindhoven, Netherlands
Duration: 26 Apr 201326 Apr 2013

Conference

ConferenceDutch Scanning Probe Microscopy Day 2013
CountryNetherlands
CityEindhoven
Period26/04/1326/04/13

Keywords

  • METIS-299887

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