Real time atomic force microscopy growth monitoring during pulsed laser deposition

W.A. Wessels, Joska Johannes Broekmaat, G.J.C. Baarle, Gertjan Koster, Augustinus J.H.M. Rijnders

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 26 Apr 2013
Event	Dutch Scanning Probe Microscopy Day 2013 - Eindhoven, Netherlands Duration: 26 Apr 2013 → 26 Apr 2013

Conference	Dutch Scanning Probe Microscopy Day 2013
Country/Territory	Netherlands
City	Eindhoven
Period	26/04/13 → 26/04/13

Keywords

@conference{069789f6ba0a4e9bb858c82eb0121567,

title = "Real time atomic force microscopy growth monitoring during pulsed laser deposition",

keywords = "METIS-299887",

author = "W.A. Wessels and Broekmaat, {Joska Johannes} and G.J.C. Baarle and Gertjan Koster and Rijnders, {Augustinus J.H.M.}",

year = "2013",

month = apr,

day = "26",

language = "Undefined",

pages = "--",

note = "Dutch Scanning Probe Microscopy Day 2013 ; Conference date: 26-04-2013 Through 26-04-2013",

}

TY - CONF

T1 - Real time atomic force microscopy growth monitoring during pulsed laser deposition

AU - Wessels, W.A.

AU - Broekmaat, Joska Johannes

AU - Baarle, G.J.C.

AU - Koster, Gertjan

AU - Rijnders, Augustinus J.H.M.

PY - 2013/4/26

Y1 - 2013/4/26

KW - METIS-299887

M3 - Poster

SP - -

T2 - Dutch Scanning Probe Microscopy Day 2013

Y2 - 26 April 2013 through 26 April 2013

ER -