Real time atomic force microscopy growth monitoring during pulsed laser deposition

W.A. Wessels, Joska Johannes Broekmaat, G.J.C. Baarle, Gertjan Koster, Augustinus J.H.M. Rijnders

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 11 Dec 2013
Event	MicroNanoConference 2013 - De Reehorst, Ede, Netherlands Duration: 11 Dec 2013 → 12 Dec 2013

Keywords

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title = "Real time atomic force microscopy growth monitoring during pulsed laser deposition",

keywords = "METIS-299888",

author = "W.A. Wessels and Broekmaat, {Joska Johannes} and G.J.C. Baarle and Gertjan Koster and Rijnders, {Augustinus J.H.M.}",

year = "2013",

month = dec,

day = "11",

language = "Undefined",

pages = "--",

note = "MicroNanoConference 2013 ; Conference date: 11-12-2013 Through 12-12-2013",

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TY - CONF

T1 - Real time atomic force microscopy growth monitoring during pulsed laser deposition

AU - Wessels, W.A.

AU - Broekmaat, Joska Johannes

AU - Baarle, G.J.C.

AU - Koster, Gertjan

AU - Rijnders, Augustinus J.H.M.

PY - 2013/12/11

Y1 - 2013/12/11

KW - METIS-299888

M3 - Poster

SP - -

T2 - MicroNanoConference 2013

Y2 - 11 December 2013 through 12 December 2013

ER -