Real-Time Ellipsometry for monitoring the Growth of Cesium-Telluride Photocathodes

Petrus J.M. van der Slot, Klaus J. Boller, R.A. Loch, M.J.H. Luttikhof, L.G. Prodan, M. Tesselaar, Jeroen W.J. Verschuur

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined
Title of host publicationProceedings 30th Annual International Free Electron Laser Conference
Place of PublicationGyeongju
PublisherPohang Accelerator Laboratory
Pages448-451
Publication statusPublished - 24 Aug 2009
Event30th International Free Electron Laser Conference, FEL 2008 - Gyeongju, Korea, Republic of
Duration: 24 Aug 200829 Aug 2008
Conference number: 30

Conference

Conference30th International Free Electron Laser Conference, FEL 2008
Abbreviated titleFEL
CountryKorea, Republic of
CityGyeongju
Period24/08/0829/08/08

Keywords

  • METIS-265937

Cite this

van der Slot, P. J. M., Boller, K. J., Loch, R. A., Luttikhof, M. J. H., Prodan, L. G., Tesselaar, M., & Verschuur, J. W. J. (2009). Real-Time Ellipsometry for monitoring the Growth of Cesium-Telluride Photocathodes. In Proceedings 30th Annual International Free Electron Laser Conference (pp. 448-451). Gyeongju: Pohang Accelerator Laboratory.