Real-time growth monitoring by high-pressure RHEED during Pulsed Laser Deposition

Augustinus J.H.M. Rijnders, David H.A. Blank

Research output: Chapter in Book/Report/Conference proceedingChapterProfessional

Original languageUndefined
Title of host publicationThin Films and Hetereostructures for Oxide Electronics
EditorsS.B. Ogale
Place of PublicationNew York, USA
PublisherSpringer
Pages355-384-
ISBN (Print)0-387-25802-7
Publication statusPublished - 2005

Publication series

Name
PublisherSpringer Science + Business Media, Inc.

Keywords

  • IR-53468
  • METIS-226304

Cite this

Rijnders, A. J. H. M., & Blank, D. H. A. (2005). Real-time growth monitoring by high-pressure RHEED during Pulsed Laser Deposition. In S. B. Ogale (Ed.), Thin Films and Hetereostructures for Oxide Electronics (pp. 355-384-). New York, USA: Springer.