Abstract
The processes of melting and crystallization of poly(ethylene oxide) are followed in real time at elevated temperature by atomic force microscopy using a simple hot stage apparatus. Hedritic development at a temperature of 57°C is monitored, including the process of lamellar splaying to yield a spherical morphology. Crystal growth kinetics are measured by monitoring the growth of individual lamellae and found to agree with those obtained by conventional optical microscopy.
Original language | Undefined |
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Pages (from-to) | 1237-1242 |
Number of pages | 6 |
Journal | Polymer |
Volume | 39 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1998 |
Keywords
- IR-71463
- METIS-105736
- Crystallization
- Atomic Force Microscopy
- Poly(ethylene oxide)