The processes of melting and crystallization of poly(ethylene oxide) are followed in real time at elevated temperature by atomic force microscopy using a simple hot stage apparatus. Hedritic development at a temperature of 57°C is monitored, including the process of lamellar splaying to yield a spherical morphology. Crystal growth kinetics are measured by monitoring the growth of individual lamellae and found to agree with those obtained by conventional optical microscopy.
- Atomic Force Microscopy
- Poly(ethylene oxide)