Real-time measurements of sliding friction and elastic properties of ZnO nanowires inside a scanning electron microscope

B. Polyakov*, L. M. Dorogin, S. Vlassov, I. Kink, A. Lohmus, A. E. Romanov, R. Lohmus

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

22 Citations (Scopus)

Abstract

A real-time nanomanipulation technique inside a scanning electron microscope (SEM) has been used to investigate the elastic and frictional (tribological) properties of zinc oxide nanowires (NWs). A NW was translated over a surface of an oxidised silicon wafer using a nanomanipulator with a glued atomic-force microscopic tip. The shape of the NW elastically deformed during the translation was used to determine the distributed kinetic friction force. The same NW was then positioned half-suspended on edges of trenches cut by a focused ion beam through a silicon wafer. In order to measure Young’s modulus, the NW was bent by pushing it at the free end with the tip, and the interaction force corresponding to the visually observed bending angle was measured with a quartz tuning fork force sensor.
Original languageEnglish
Pages (from-to)1244-1247
JournalSolid state communications
Volume151
Issue number18
DOIs
Publication statusPublished - 2011
Externally publishedYes

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