Reappraisal of the validity of IEM model

T. D. Wu*, K. S. Chen, A. K. Fung, Z. Su, P. Trouch, Rudi Hoeben, Marco Mancini

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

A surface scattering model based on the integral equation method is examined in terms of its applicability to laboratory measurements. The Fresnel reflection coefficients used in the model have been approximated as a function of the incident angle at low frequency and a function of the specular angle at high frequency. Based on a limited set of experimental measurements, a transition function are suggested for estimating the Fresnel reflection coefficients in the intermediate regions. Results of comparison indicate that the IEM is accurate and practical to use. Issue raised from dielectric information is also addressed.

Original languageEnglish
Title of host publication IGARSS'97. 1997 IEEE International Geoscience and Remote Sensing Symposium Proceedings. Remote Sensing - A Scientific Vision for Sustainable Development
Place of PublicationSingapore
PublisherIEEE
Pages1365-1367
Number of pages3
ISBN (Print)0-7803-3836-7
DOIs
Publication statusPublished - 3 Aug 1997
Externally publishedYes
EventIEEE International Geoscience and Remote Sensing Symposium, IGARSS 1997 - Singapore, Singapore
Duration: 3 Aug 19978 Aug 1997

Conference

ConferenceIEEE International Geoscience and Remote Sensing Symposium, IGARSS 1997
Abbreviated titleIGARSS 1997
CountrySingapore
CitySingapore
Period3/08/978/08/97

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