Recent Progress in Noise Thermometry at 505 K and 693 K Using Quantized Voltage Noise Ratio Spectra

W.L. Tew, S. Benz, P.D. Dresselhaus, Horst Rogalla, D.R. White, J.R. Labenski

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of TEMPMEKO & ISHM 2010
    Place of PublicationPortoroz, Slovenia
    Publication statusPublished - 31 May 2010


    • METIS-271714

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