TY - JOUR
T1 - Reducing the cost of single error correction with parity sharing
AU - Reviriego, P.
AU - Pontarelli, S.
AU - Maestro, J.A.
AU - Ottavi, M.
PY - 2013
Y1 - 2013
N2 - Error correction codes (ECCs) are commonly used to protect memory devices from errors. The most commonly used codes are a simple parity bit and single-error-correction (SEC) codes. A parity bit enables single-bit error detection, whereas a SEC code can correct one-bit errors. A SEC code requires more additional bits per word and also more complex decoding that impacts delay. A tradeoff between both schemes is the use of a product code based on a combination of two parity bits. This approach reduces the memory overhead at the expense of a more complex access procedure. In this letter, an alternative scheme based on the use of parity sharing is proposed and evaluated. The results show that the new approach significantly reduces the memory overhead and is also capable of correcting single-bit errors.
AB - Error correction codes (ECCs) are commonly used to protect memory devices from errors. The most commonly used codes are a simple parity bit and single-error-correction (SEC) codes. A parity bit enables single-bit error detection, whereas a SEC code can correct one-bit errors. A SEC code requires more additional bits per word and also more complex decoding that impacts delay. A tradeoff between both schemes is the use of a product code based on a combination of two parity bits. This approach reduces the memory overhead at the expense of a more complex access procedure. In this letter, an alternative scheme based on the use of parity sharing is proposed and evaluated. The results show that the new approach significantly reduces the memory overhead and is also capable of correcting single-bit errors.
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84883787107&partnerID=MN8TOARS
U2 - 10.1109/TDMR.2013.2272484
DO - 10.1109/TDMR.2013.2272484
M3 - Article
SN - 1530-4388
VL - 13
SP - 420
EP - 422
JO - IEEE transactions on device and materials reliability
JF - IEEE transactions on device and materials reliability
IS - 3
ER -