Reducing the Susceptibility of Design-for-Delay-Testability Structures to Process- and Application-Induced Variations

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the ETW
    Place of PublicationStockholm, Sweden
    Number of pages7
    Publication statusPublished - 29 May 2001


    • METIS-201874

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