Reducing the Susceptibility of Design-for-Delay-Testability Structures to Process- and Application-Induced Variations

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the ETW
    Place of PublicationStockholm, Sweden
    Pages35-41
    Number of pages7
    Publication statusPublished - 29 May 2001

    Keywords

    • METIS-201874

    Cite this

    @inproceedings{3ad97c84953843e4b2617576347ca71c,
    title = "Reducing the Susceptibility of Design-for-Delay-Testability Structures to Process- and Application-Induced Variations",
    keywords = "METIS-201874",
    author = "H.J. Vermaak and Kerkhoff, {Hans G.}",
    year = "2001",
    month = "5",
    day = "29",
    language = "Undefined",
    isbn = "0-7695-1017-5",
    pages = "35--41",
    booktitle = "Proceedings of the ETW",

    }

    Reducing the Susceptibility of Design-for-Delay-Testability Structures to Process- and Application-Induced Variations. / Vermaak, H.J.; Kerkhoff, Hans G.

    Proceedings of the ETW. Stockholm, Sweden, 2001. p. 35-41.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Reducing the Susceptibility of Design-for-Delay-Testability Structures to Process- and Application-Induced Variations

    AU - Vermaak, H.J.

    AU - Kerkhoff, Hans G.

    PY - 2001/5/29

    Y1 - 2001/5/29

    KW - METIS-201874

    M3 - Conference contribution

    SN - 0-7695-1017-5

    SP - 35

    EP - 41

    BT - Proceedings of the ETW

    CY - Stockholm, Sweden

    ER -