Reduction of 1/f Noise by Switched Biasing: an Overview

Eric Klumperink, Arnoud van der Wel, Jay Kolhatkar, Eric Hoekstra, Cora Salm, Hans Wallinga, Bram Nauta

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    Abstract

    MOSFETs are notorious for having strong low frequency noise (1/f noise or flicker noise). In the late 90's we discovered that this noise can be reduced if you periodically switch the bias on and off. This lead to a STW research project "Reduction of 1/f Noise in MOSFETs by Switched Bias Techniques" (TEL.4756), in which we tried to model the effect of large signal excitation on LF noise and explore its application perspective. This paper gives an overview of the main results obtained during this project. We found that the reduction of LF noise is related to capture and emission of electrons in traps, which renders Random Telegraph Noise (RTS noise). The effect of large signal excitation on LF noise can be modeled by making capture and emission time-constants dependent on the instantaneous bias voltage. We were able to show that the energy distribution of traps in the band-gap determines whether there will be significant noise reduction or not.
    Original languageEnglish
    Title of host publication16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005
    Place of PublicationUtrecht
    PublisherSTW
    Pages307-315
    Number of pages9
    ISBN (Print)90-73461-50-2
    Publication statusPublished - Nov 2005
    Event16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005 - Veldhoven, Netherlands
    Duration: 17 Nov 200518 Nov 2005
    Conference number: 16

    Workshop

    Workshop16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005
    CountryNetherlands
    CityVeldhoven
    Period17/11/0518/11/05

    Keywords

    • RTS noise
    • Noise reduction
    • Flicker noise
    • Switched biasing
    • CMOS
    • Low frequency noise
    • MOSFET
    • 1/f noise

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  • Cite this

    Klumperink, E., van der Wel, A., Kolhatkar, J., Hoekstra, E., Salm, C., Wallinga, H., & Nauta, B. (2005). Reduction of 1/f Noise by Switched Biasing: an Overview. In 16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005 (pp. 307-315). Utrecht: STW.