Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques

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Abstract

Switched Biasing is presented as a technique for reducing the 1/f noise in MOSFETS. It exploits an intriguing physical effect: cycling a MOS transistor from strong inversion to accumulation reduces its 1/f noise!! The history of the discovery of the effect and the main experimental results obtained so far will be reviewed.
Original languageUndefined
Title of host publicationProceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing
EditorsJean Pierre Veen
Place of PublicationMierlo The Netherlands
Pages285-290
Number of pages6
Publication statusPublished - 30 Nov 1998
Event9th ProRISC/IEEE workshop on Circuits, Systems and Signal Processing, CSSP 1998 - Mierlo, The Netherlands, Utrecht, Netherlands
Duration: 25 Nov 199827 Nov 1998
Conference number: 9

Conference

Conference9th ProRISC/IEEE workshop on Circuits, Systems and Signal Processing, CSSP 1998
Abbreviated titleCSSP
CountryNetherlands
CityUtrecht
Period25/11/9827/11/98

Keywords

  • IR-15959
  • METIS-112841

Cite this

Klumperink, E. A. M., Gierkink, S. L. J., Wallinga, H., & Nauta, B. (1998). Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. In J. P. Veen (Ed.), Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing (pp. 285-290). Mierlo The Netherlands.
Klumperink, Eric A.M. ; Gierkink, Sander L.J. ; Wallinga, Hans ; Nauta, Bram. / Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing. editor / Jean Pierre Veen. Mierlo The Netherlands, 1998. pp. 285-290
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title = "Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques",
abstract = "Switched Biasing is presented as a technique for reducing the 1/f noise in MOSFETS. It exploits an intriguing physical effect: cycling a MOS transistor from strong inversion to accumulation reduces its 1/f noise!! The history of the discovery of the effect and the main experimental results obtained so far will be reviewed.",
keywords = "IR-15959, METIS-112841",
author = "Klumperink, {Eric A.M.} and Gierkink, {Sander L.J.} and Hans Wallinga and Bram Nauta",
year = "1998",
month = "11",
day = "30",
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isbn = "90-73461-14-6",
pages = "285--290",
editor = "Veen, {Jean Pierre}",
booktitle = "Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing",

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Klumperink, EAM, Gierkink, SLJ, Wallinga, H & Nauta, B 1998, Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. in JP Veen (ed.), Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing. Mierlo The Netherlands, pp. 285-290, 9th ProRISC/IEEE workshop on Circuits, Systems and Signal Processing, CSSP 1998, Utrecht, Netherlands, 25/11/98.

Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. / Klumperink, Eric A.M.; Gierkink, Sander L.J.; Wallinga, Hans; Nauta, Bram.

Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing. ed. / Jean Pierre Veen. Mierlo The Netherlands, 1998. p. 285-290.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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T1 - Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques

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AU - Wallinga, Hans

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PY - 1998/11/30

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AB - Switched Biasing is presented as a technique for reducing the 1/f noise in MOSFETS. It exploits an intriguing physical effect: cycling a MOS transistor from strong inversion to accumulation reduces its 1/f noise!! The history of the discovery of the effect and the main experimental results obtained so far will be reviewed.

KW - IR-15959

KW - METIS-112841

M3 - Conference contribution

SN - 90-73461-14-6

SP - 285

EP - 290

BT - Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing

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Klumperink EAM, Gierkink SLJ, Wallinga H, Nauta B. Reduction of 1/f Noise in MOSFETS by Switched Bias Techniques. In Veen JP, editor, Proceedings of the 9th IEEE/ProRISC Workshop on Circuits, Systems and Signal Processing. Mierlo The Netherlands. 1998. p. 285-290