Abstract
The hydrogen in PECVD-SiOxNy was studied with IR spectroscopy and ERD analysis as a function of the O/N ratio and the annealing treatment up to 1150°C. The results were compared with measured spectral waveguide losses
| Original language | Undefined |
|---|---|
| Title of host publication | LEOS '95, IEEE Lasers and electro-optics society 1995 |
| Place of Publication | San Fransisco |
| Publisher | IEEE |
| Pages | 88-89 |
| DOIs | |
| Publication status | Published - 30 Oct 1995 |
| Event | 8th Annual Meeting of the Lasers and Electro-Optics Society (LEOS) 1995 - San Francisco, United States Duration: 30 Oct 1995 → 31 Oct 1995 Conference number: 8 |
Publication series
| Name | |
|---|---|
| Publisher | IEEE |
| Volume | 2 |
Conference
| Conference | 8th Annual Meeting of the Lasers and Electro-Optics Society (LEOS) 1995 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 30/10/95 → 31/10/95 |
Keywords
- METIS-112750
- IR-15868
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