Reduction of Test Time in VLIW-TTA Processors

V. Zivkovic, Hans G. Kerkhoff, R.J.W.T. Tangelder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC Conference
Place of Publication	Veldhoven, the Netherlands
Pages	753-760
Number of pages	8
Publication status	Published - 29 Nov 2001
Event	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands Duration: 25 Nov 2003 → 27 Nov 2003 Conference number: 14

Workshop	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
Abbreviated title	ProRISC
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/03 → 27/11/03

Keywords

@inproceedings{11a3268189124fd68dab801123fd9fe3,

title = "Reduction of Test Time in VLIW-TTA Processors",

keywords = "METIS-201883",

author = "V. Zivkovic and Kerkhoff, {Hans G.} and R.J.W.T. Tangelder",

year = "2001",

month = nov,

day = "29",

language = "Undefined",

isbn = "90-73461-29-4",

pages = "753--760",

booktitle = "Proceedings of the ProRISC Conference",

note = "14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 ; Conference date: 25-11-2003 Through 27-11-2003",

}

TY - GEN

T1 - Reduction of Test Time in VLIW-TTA Processors

AU - Zivkovic, V.

AU - Kerkhoff, Hans G.

AU - Tangelder, R.J.W.T.

N1 - Conference code: 14

PY - 2001/11/29

Y1 - 2001/11/29

KW - METIS-201883

M3 - Conference contribution

SN - 90-73461-29-4

SP - 753

EP - 760

BT - Proceedings of the ProRISC Conference

CY - Veldhoven, the Netherlands

T2 - 14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003

Y2 - 25 November 2003 through 27 November 2003

ER -