Abstract
Spectrum measurement results of a CMOS ring oscillator are presented that show a 10 dB decrease in 1/f noise induced phase noise at a 2 dB increase in carrier power. Simple ring oscillator theory predicts that the 1/f noise induced phase noise is independent of carrier power. It is shown that an increase in the amplitude of oscillation is accompanied by a reduction of the intrinsic 1/f noise of the periodically switched MOS transistors in the ring. A net reduction of the 1/f noise of a periodically switched NMOS transistor of more than 12 dB is measured in the baseband
Original language | English |
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Title of host publication | 1998 IEEE International Symposium on Circuits and Systems (ISCAS) |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Number of pages | 4 |
Volume | 1 |
ISBN (Print) | 0-7803-4455-3 |
DOIs | |
Publication status | Published - 31 May 1998 |
Event | IEEE International Symposium on Circuits and Systems, ISCAS 1998 - Monterey, United States Duration: 31 May 1998 → 3 Jun 1998 |
Conference
Conference | IEEE International Symposium on Circuits and Systems, ISCAS 1998 |
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Abbreviated title | ISCAS |
Country/Territory | United States |
City | Monterey |
Period | 31/05/98 → 3/06/98 |