Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

A.J. Been, Gerrit Adriaan Folkertsma, G.A. Folkertsma, H.H.J. Verputten, Thijs Bolhuis, Leon Abelmann

    Research output: Contribution to journalArticleAcademicpeer-review

    Abstract

    Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.
    Original languageUndefined
    Article number10.1093/jmicro/dfp002
    Pages (from-to)251-252
    Number of pages2
    JournalJournal of electron microscopy
    Volume58
    Issue number4
    DOIs
    Publication statusPublished - 24 Jan 2009

    Keywords

    • TST-uSPAM: micro Scanning Probe Array Memory
    • TST-SMI: Formerly in EWI-SMI
    • Instrumentation
    • Electron microscopy
    • electric circuitry
    • IR-67698
    • magnetic fields
    • disturbance
    • EWI-15246
    • METIS-264394
    • calculations

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