Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT . We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.
- TST-uSPAM: micro Scanning Probe Array Memory
- TST-SMI: Formerly in EWI-SMI
- Electron microscopy
- electric circuitry
- magnetic fields
Been, A. J., Folkertsma, G. A., Folkertsma, G. A., Verputten, H. H. J., Bolhuis, T., & Abelmann, L. (2009). Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting. Journal of electron microscopy, 58(4), 251-252. [10.1093/jmicro/dfp002]. https://doi.org/10.1093/jmicro/dfp002