Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

Auke J. Been; Gerrit A. Folkertsma; Hein H.J. Verputten; Thijs Bolhuis; Leon Abelmann

doi:10.1093/jmicro/dfp002

Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

Auke J. Been, Gerrit A. Folkertsma, Hein H.J. Verputten, Thijs Bolhuis, Leon Abelmann

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Abstract

Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.

Original language	English
Pages (from-to)	251-252
Number of pages	2
Journal	Journal of electron microscopy
Volume	58
Issue number	4
DOIs	https://doi.org/10.1093/jmicro/dfp002
Publication status	Published - 24 Jan 2009

Keywords

TST-uSPAM: micro Scanning Probe Array Memory
TST-SMI: Formerly in EWI-SMI
Instrumentation
Electron microscopy
Electric circuitry
Magnetic fields
Disturbance
Calculations

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10.1093/jmicro/dfp002

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title = "Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting",

abstract = "Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.",

keywords = "TST-uSPAM: micro Scanning Probe Array Memory, TST-SMI: Formerly in EWI-SMI, Instrumentation, Electron microscopy, Electric circuitry, Magnetic fields, Disturbance, Calculations",

author = "Been, {Auke J.} and Folkertsma, {Gerrit A.} and Verputten, {Hein H.J.} and Thijs Bolhuis and Leon Abelmann",

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AU - Been, Auke J.

AU - Folkertsma, Gerrit A.

AU - Verputten, Hein H.J.

AU - Bolhuis, Thijs

AU - Abelmann, Leon

PY - 2009/1/24

Y1 - 2009/1/24

N2 - Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.

AB - Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.

KW - TST-uSPAM: micro Scanning Probe Array Memory

KW - TST-SMI: Formerly in EWI-SMI

KW - Instrumentation

KW - Electron microscopy

KW - Electric circuitry

KW - Magnetic fields

KW - Disturbance

KW - Calculations

U2 - 10.1093/jmicro/dfp002

DO - 10.1093/jmicro/dfp002

M3 - Article

SN - 0022-0744

VL - 58

SP - 251

EP - 252

JO - Journal of electron microscopy

JF - Journal of electron microscopy

IS - 4

ER -

Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

Abstract

Keywords

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