Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

1 Citation (Scopus)
Original languageUndefined
Title of host publicationIn situ characterization of thin film growth
EditorsG. Koster, A.J.H.M. Rijnders
Place of PublicationCambridge, UK
PublisherWoodhead Publishing
Pages3-28
ISBN (Print)978-1-84569-934-5
Publication statusPublished - 2011

Keywords

  • METIS-280151

Cite this

Koster, G. (2011). Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth. In G. Koster, & A. J. H. M. Rijnders (Eds.), In situ characterization of thin film growth (pp. 3-28). Cambridge, UK: Woodhead Publishing.