Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	Undefined
Title of host publication	In situ characterization of thin film growth
Editors	G. Koster, A.J.H.M. Rijnders
Place of Publication	Cambridge, UK
Publisher	Woodhead Publishing
Pages	3-28
ISBN (Print)	978-1-84569-934-5
Publication status	Published - 2011

Keywords

@inbook{659df2a919744696819f1da965c3d977,

title = "Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth",

keywords = "METIS-280151",

author = "Gertjan Koster",

year = "2011",

language = "Undefined",

isbn = "978-1-84569-934-5",

pages = "3--28",

editor = "G. Koster and A.J.H.M. Rijnders",

booktitle = "In situ characterization of thin film growth",

publisher = "Woodhead Publishing",

}