Refractive index and layer thickness of an adsorbing protein as reporters of monolayer formation

R.P.H. Kooyman, Jan Greve, R.G.C. Oudshoorn

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Abstract

A method is presented for a separate real-time determination of refractive index and layer thickness of an adsorbing thin layer. The changing angular deflections of TE and TM modes in a dedicated planar waveguide structure are measured. A resolution of 0.01 in the refractive index and 0.5 nm in the average thickness is obtained. The method is illustrated with experimental results on the binding of an antibody to the substrate, both in a physisorption and in an immunoreaction. In the latter, results are consistent with an end-on binding of the antibody to the surface.
Original languageUndefined
Pages (from-to)836-840
Number of pages5
JournalThin solid films
Volume284
Issue number285
DOIs
Publication statusPublished - 1996

Keywords

  • Evanescent field
  • Monolayers
  • METIS-129339
  • Optical waveguide
  • IR-24539
  • Protein adsorption

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