Refractometric sensor based on silicon photonic wires

L.J. Kauppinen, Hugo Hoekstra, R.M. de Ridder

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    Abstract

    We have characterized the refractive index sensing properties of a compact refractometric sensor based on a grated silicon photonic wire. A resolution of 10^-5 in refractive index has been measured.
    Original languageUndefined
    Title of host publication3rd EOS Topical Meeting on Optical Microsystems (OMS09)
    Place of PublicationHannover, Germany
    PublisherEuropean Optical Society (EOS)
    Pages2118
    Number of pages2
    ISBN (Print)978-3-00-024191-8
    Publication statusPublished - Sep 2009
    Event3rd EOS Topical Meeting on Optical Microsystems 2009 - Capri, Italy
    Duration: 27 Sep 200930 Sep 2009
    Conference number: 3

    Conference

    Conference3rd EOS Topical Meeting on Optical Microsystems 2009
    CountryItaly
    CityCapri
    Period27/09/0930/09/09

    Keywords

    • METIS-264301
    • IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES
    • IOMS-SNS: SENSORS
    • EWI-17501

    Cite this

    Kauppinen, L. J., Hoekstra, H., & de Ridder, R. M. (2009). Refractometric sensor based on silicon photonic wires. In 3rd EOS Topical Meeting on Optical Microsystems (OMS09) (pp. 2118). Hannover, Germany: European Optical Society (EOS).