Refractometric sensor based on silicon photonic wires

L.J. Kauppinen, Hugo Hoekstra, R.M. de Ridder

    Abstract

    We have characterized the refractive index sensing properties of a compact refractometric sensor based on a grated silicon photonic wire. A resolution of 10^-5 in refractive index has been measured.
    Original languageUndefined
    Title of host publication3rd EOS Topical Meeting on Optical Microsystems (OMS09)
    Place of PublicationHannover, Germany
    PublisherEuropean Optical Society (EOS)
    Pages2118
    Number of pages2
    ISBN (Print)978-3-00-024191-8
    StatePublished - Sep 2009
    Event3rd EOS Topical Meeting on Optical Microsystems 2009 - Capri, Italy

    Conference

    Conference3rd EOS Topical Meeting on Optical Microsystems 2009
    CountryItaly
    CityCapri
    Period27/09/0930/09/09

    Fingerprint

    refractivity
    wire
    photonics
    sensors
    silicon

    Keywords

    • METIS-264301
    • IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES
    • IOMS-SNS: SENSORS
    • EWI-17501

    Cite this

    Kauppinen, L. J., Hoekstra, H., & de Ridder, R. M. (2009). Refractometric sensor based on silicon photonic wires. In 3rd EOS Topical Meeting on Optical Microsystems (OMS09) (pp. 2118). Hannover, Germany: European Optical Society (EOS).

    Kauppinen, L.J.; Hoekstra, Hugo; de Ridder, R.M. / Refractometric sensor based on silicon photonic wires.

    3rd EOS Topical Meeting on Optical Microsystems (OMS09). Hannover, Germany : European Optical Society (EOS), 2009. p. 2118.

    Research output: Scientific - peer-reviewConference contribution

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    title = "Refractometric sensor based on silicon photonic wires",
    abstract = "We have characterized the refractive index sensing properties of a compact refractometric sensor based on a grated silicon photonic wire. A resolution of 10^-5 in refractive index has been measured.",
    keywords = "METIS-264301, IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES, IOMS-SNS: SENSORS, EWI-17501",
    author = "L.J. Kauppinen and Hugo Hoekstra and {de Ridder}, R.M.",
    year = "2009",
    month = "9",
    isbn = "978-3-00-024191-8",
    pages = "2118",
    booktitle = "3rd EOS Topical Meeting on Optical Microsystems (OMS09)",
    publisher = "European Optical Society (EOS)",

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    Kauppinen, LJ, Hoekstra, H & de Ridder, RM 2009, Refractometric sensor based on silicon photonic wires. in 3rd EOS Topical Meeting on Optical Microsystems (OMS09). European Optical Society (EOS), Hannover, Germany, pp. 2118, 3rd EOS Topical Meeting on Optical Microsystems 2009, Capri, Italy, 27-30 September.

    Refractometric sensor based on silicon photonic wires. / Kauppinen, L.J.; Hoekstra, Hugo; de Ridder, R.M.

    3rd EOS Topical Meeting on Optical Microsystems (OMS09). Hannover, Germany : European Optical Society (EOS), 2009. p. 2118.

    Research output: Scientific - peer-reviewConference contribution

    TY - CHAP

    T1 - Refractometric sensor based on silicon photonic wires

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    AU - Hoekstra,Hugo

    AU - de Ridder,R.M.

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    N2 - We have characterized the refractive index sensing properties of a compact refractometric sensor based on a grated silicon photonic wire. A resolution of 10^-5 in refractive index has been measured.

    AB - We have characterized the refractive index sensing properties of a compact refractometric sensor based on a grated silicon photonic wire. A resolution of 10^-5 in refractive index has been measured.

    KW - METIS-264301

    KW - IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES

    KW - IOMS-SNS: SENSORS

    KW - EWI-17501

    M3 - Conference contribution

    SN - 978-3-00-024191-8

    SP - 2118

    BT - 3rd EOS Topical Meeting on Optical Microsystems (OMS09)

    PB - European Optical Society (EOS)

    ER -

    Kauppinen LJ, Hoekstra H, de Ridder RM. Refractometric sensor based on silicon photonic wires. In 3rd EOS Topical Meeting on Optical Microsystems (OMS09). Hannover, Germany: European Optical Society (EOS). 2009. p. 2118.