Relation between noise and resolution in integrated optical refractometric sensing

Hugo Hoekstra; Paul Lambeck; H.P. Uranus; T.M. Koster

doi:10.1016/j.snb.2008.06.025

Relation between noise and resolution in integrated optical refractometric sensing

Hugo Hoekstra, Paul Lambeck, H.P. Uranus, T.M. Koster

Research output: Contribution to journal › Article › Academic › peer-review

9 Citations (Scopus)

Abstract

The paper presents a general theory for integrated optical (IO) sensing devices of the refractometric type, which relates noise and device parameters to the resolution of the measurand induced modal index changes. The theory is applied for length optimization of a number of integrated optical sensing devices. The results show the crucial importance of loss for the maximum attainable resolution of a given sensor. The presented theory is illustrated with numerical examples

Original language	Undefined
Article number	10.1016/j.snb.2008.06.025
Pages (from-to)	702-710
Number of pages	9
Journal	Sensors and actuators. B: Chemical
Volume	134
Issue number	2008/14935/2
DOIs	https://doi.org/10.1016/j.snb.2008.06.025
Publication status	Published - 25 Sep 2008

Keywords

IR-62622
EWI-14638
METIS-255022
IOMS-SNS: SENSORS

Access to Document

10.1016/j.snb.2008.06.025

http://eprints.eemcs.utwente.nl/secure2/14638/01/Hoekstra_HJWM_Sensors_Actuators_B-Chem._Vol_134_No2_Pp702-710.pdf

Cite this

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AU - Koster, T.M.

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