| Original language | English |
|---|---|
| Title of host publication | Ellipsometry at the Nanoscale |
| Editors | M. Losurdo, K. Hingerl |
| Place of Publication | Heidelberg, Berlin, New York |
| Publisher | Springer |
| Pages | - |
| Number of pages | 23 |
| ISBN (Print) | 978-3-642-33955-4 |
| Publication status | Published - 2013 |
Publication series
| Name | |
|---|---|
| Publisher | Springer-Verlag |
Keywords
- METIS-296588
- IR-89925