Reliability Assessment of Memristor based Gas Sensor Array

Vishal Gupta; Giulio Panunzi; Saurabh Khandelwal; Eugenio Martinelli; Abusaleh Jabir; Marco Ottavi

doi:10.1109/DFT52944.2021.9568304

Reliability Assessment of Memristor based Gas Sensor Array

Vishal Gupta, Giulio Panunzi, Saurabh Khandelwal, Eugenio Martinelli, Abusaleh Jabir, Marco Ottavi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Sensors are an essential part of every intelligent monitoring system. Memristor based gas sensor devices are rapidly emerging due to offering various advantages and are providing a wide range of applications in the next generation technologies. Moreover, memristor based gas sensor arrays are used to minimize measurement errors. Reliability is one of the key aspects of such arrays/structures. This article provides a new framework for reliability assessment of a memristor based sensor array by considering the probability of the chip to have optimal sensing responses when faults/defects affect the array. The Markovian model is proposed for the reliability assessment in both cases with and without spare rows. Constant fault rate is estimated over the period to guarantee that the fault model does not alter. Furthermore, Mean Time To Failure (MTTF) is also evaluated which shows how the productive process affects life time of the device. The proposed assessment framework is appropriate to analyze the reliability for different fault models, architectures and arrays including the redundancy allocations.

Original language	English
Title of host publication	2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Editors	Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Electronic)	978-1-6654-1609-2
ISBN (Print)	978-1-6654-1610-8
DOIs	https://doi.org/10.1109/DFT52944.2021.9568304
Publication status	Published - 8 Oct 2021
Externally published	Yes
Event	34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021 - Virtual, Athens, Greece Duration: 6 Oct 2021 → 8 Oct 2021 Conference number: 34

Publication series

Name	IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Publisher	IEEE
Volume	2021
ISSN (Print)	2576-1501
ISSN (Electronic)	2765-933X

Conference

Conference	34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021
Abbreviated title	DFT 2021
Country/Territory	Greece
City	Virtual, Athens
Period	6/10/21 → 8/10/21

Keywords

Analytical models
Microprocessors
Memristors
Computer architecture
Very large scale integration
Sensor systems
Reliability
n/a OA procedure

Access to Document

10.1109/DFT52944.2021.9568304

Cite this

Gupta, V., Panunzi, G., Khandelwal, S., Martinelli, E., Jabir, A., & Ottavi, M. (2021). Reliability Assessment of Memristor based Gas Sensor Array. In L. Dilillo, L. Cassano, & A. Papadimitriou (Eds.), 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 1-6). Article 9568304 (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT); Vol. 2021). IEEE. https://doi.org/10.1109/DFT52944.2021.9568304

Gupta, Vishal ; Panunzi, Giulio ; Khandelwal, Saurabh et al. / Reliability Assessment of Memristor based Gas Sensor Array. 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). editor / Luigi Dilillo ; Luca Cassano ; Athanasios Papadimitriou. Piscataway, NJ : IEEE, 2021. pp. 1-6 (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)).

@inproceedings{bdac7095ca834616b1aa4c40460637c4,

title = "Reliability Assessment of Memristor based Gas Sensor Array",

abstract = "Sensors are an essential part of every intelligent monitoring system. Memristor based gas sensor devices are rapidly emerging due to offering various advantages and are providing a wide range of applications in the next generation technologies. Moreover, memristor based gas sensor arrays are used to minimize measurement errors. Reliability is one of the key aspects of such arrays/structures. This article provides a new framework for reliability assessment of a memristor based sensor array by considering the probability of the chip to have optimal sensing responses when faults/defects affect the array. The Markovian model is proposed for the reliability assessment in both cases with and without spare rows. Constant fault rate is estimated over the period to guarantee that the fault model does not alter. Furthermore, Mean Time To Failure (MTTF) is also evaluated which shows how the productive process affects life time of the device. The proposed assessment framework is appropriate to analyze the reliability for different fault models, architectures and arrays including the redundancy allocations.",

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author = "Vishal Gupta and Giulio Panunzi and Saurabh Khandelwal and Eugenio Martinelli and Abusaleh Jabir and Marco Ottavi",

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Gupta, V, Panunzi, G, Khandelwal, S, Martinelli, E, Jabir, A & Ottavi, M 2021, Reliability Assessment of Memristor based Gas Sensor Array. in L Dilillo, L Cassano & A Papadimitriou (eds), 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)., 9568304, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), vol. 2021, IEEE, Piscataway, NJ, pp. 1-6, 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Virtual, Athens, Greece, 6/10/21. https://doi.org/10.1109/DFT52944.2021.9568304

Reliability Assessment of Memristor based Gas Sensor Array. / Gupta, Vishal; Panunzi, Giulio; Khandelwal, Saurabh et al.
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). ed. / Luigi Dilillo; Luca Cassano; Athanasios Papadimitriou. Piscataway, NJ: IEEE, 2021. p. 1-6 9568304 (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT); Vol. 2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Reliability Assessment of Memristor based Gas Sensor Array

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AU - Ottavi, Marco

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N2 - Sensors are an essential part of every intelligent monitoring system. Memristor based gas sensor devices are rapidly emerging due to offering various advantages and are providing a wide range of applications in the next generation technologies. Moreover, memristor based gas sensor arrays are used to minimize measurement errors. Reliability is one of the key aspects of such arrays/structures. This article provides a new framework for reliability assessment of a memristor based sensor array by considering the probability of the chip to have optimal sensing responses when faults/defects affect the array. The Markovian model is proposed for the reliability assessment in both cases with and without spare rows. Constant fault rate is estimated over the period to guarantee that the fault model does not alter. Furthermore, Mean Time To Failure (MTTF) is also evaluated which shows how the productive process affects life time of the device. The proposed assessment framework is appropriate to analyze the reliability for different fault models, architectures and arrays including the redundancy allocations.

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KW - Analytical models

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KW - Very large scale integration

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KW - n/a OA procedure

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DO - 10.1109/DFT52944.2021.9568304

M3 - Conference contribution

SN - 978-1-6654-1610-8

T3 - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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EP - 6

BT - 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

A2 - Dilillo, Luigi

A2 - Cassano, Luca

A2 - Papadimitriou, Athanasios

PB - IEEE

CY - Piscataway, NJ

T2 - 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021

Y2 - 6 October 2021 through 8 October 2021

ER -

Gupta V, Panunzi G, Khandelwal S, Martinelli E, Jabir A, Ottavi M. Reliability Assessment of Memristor based Gas Sensor Array. In Dilillo L, Cassano L, Papadimitriou A, editors, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Piscataway, NJ: IEEE. 2021. p. 1-6. 9568304. (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)). doi: 10.1109/DFT52944.2021.9568304

Reliability Assessment of Memristor based Gas Sensor Array

Abstract

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Keywords

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