Reliability by Design: A Tool to Reduce Time-To-Market

S.W. Foo, W.L. Lien, M. Xie, D.C.L. van Geest

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of 1995 IEEE Anual International Engineering Management Conference
Place of Publication	Singapore
Pages	251-256
Publication status	Published - 29 Jun 1995

Keywords

@inproceedings{f878269cb4ab4b22a86b0a27d7371e9f,

title = "Reliability by Design: A Tool to Reduce Time-To-Market",

keywords = "METIS-114383",

author = "S.W. Foo and W.L. Lien and M. Xie and {van Geest}, D.C.L.",

year = "1995",

month = jun,

day = "29",

language = "Undefined",

isbn = "0-7803-2799-3",

pages = "251--256",

booktitle = "Proceedings of 1995 IEEE Anual International Engineering Management Conference",

}