Reliability by Design: A Tool to Reduce Time-To-Market

S.W. Foo, W.L. Lien, M. Xie, D.C.L. van Geest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of 1995 IEEE Anual International Engineering Management Conference
    Place of PublicationSingapore
    Publication statusPublished - 29 Jun 1995


    • METIS-114383

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