Reliability by Design: A Tool to Reduce Time-To-Market

S.W. Foo, W.L. Lien, M. Xie, D.C.L. van Geest

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of 1995 IEEE Anual International Engineering Management Conference
    Place of PublicationSingapore
    Pages251-256
    Publication statusPublished - 29 Jun 1995

    Keywords

    • METIS-114383

    Cite this

    Foo, S. W., Lien, W. L., Xie, M., & van Geest, D. C. L. (1995). Reliability by Design: A Tool to Reduce Time-To-Market. In Proceedings of 1995 IEEE Anual International Engineering Management Conference (pp. 251-256). Singapore.