In this thesis new developments are presented for reliability engineering in RF CMOS. Given the increase in use of CMOS technology in applications for mobile communication, also the reliability of CMOS for such applications becomes increasingly important. When applied in these applications, CMOS is typically referred to as RF CMOS, where RF stands for radio frequencies.
|Qualification||Doctor of Philosophy|
|Award date||4 Jul 2008|
|Place of Publication||Enschede|
|Publication status||Published - 4 Jul 2008|
- SC-ICRY: Integrated Circuit Reliability and Yield