Reliability engineering in RF CMOS

G.T. Sasse

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    698 Downloads (Pure)


    In this thesis new developments are presented for reliability engineering in RF CMOS. Given the increase in use of CMOS technology in applications for mobile communication, also the reliability of CMOS for such applications becomes increasingly important. When applied in these applications, CMOS is typically referred to as RF CMOS, where RF stands for radio frequencies.
    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • University of Twente
    • Schmitz, Jurriaan, Supervisor
    • Kuper, F.G., Supervisor
    Thesis sponsors
    Award date4 Jul 2008
    Place of PublicationEnschede
    Print ISBNs978-90-365-2690-6
    Publication statusPublished - 4 Jul 2008


    • SC-ICRY: Integrated Circuit Reliability and Yield
    • EWI-13183
    • IR-59032
    • METIS-251124


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