Reliability engineering in RF CMOS

G.T. Sasse

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    209 Downloads (Pure)

    Abstract

    In this thesis new developments are presented for reliability engineering in RF CMOS. Given the increase in use of CMOS technology in applications for mobile communication, also the reliability of CMOS for such applications becomes increasingly important. When applied in these applications, CMOS is typically referred to as RF CMOS, where RF stands for radio frequencies.
    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Schmitz, Jurriaan , Supervisor
    • Kuper, F.G., Supervisor
    Thesis sponsors
    Award date4 Jul 2008
    Place of PublicationEnschede
    Publisher
    Print ISBNs978-90-365-2690-6
    DOIs
    Publication statusPublished - 4 Jul 2008

    Keywords

    • SC-ICRY: Integrated Circuit Reliability and Yield
    • EWI-13183
    • IR-59032
    • METIS-251124

    Cite this

    Sasse, G. T. (2008). Reliability engineering in RF CMOS. Enschede: Ipskamp Printing. https://doi.org/10.3990/1.9789036526906
    Sasse, G.T.. / Reliability engineering in RF CMOS. Enschede : Ipskamp Printing, 2008. 132 p.
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    keywords = "SC-ICRY: Integrated Circuit Reliability and Yield, EWI-13183, IR-59032, METIS-251124",
    author = "G.T. Sasse",
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    doi = "10.3990/1.9789036526906",
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    Sasse, GT 2008, 'Reliability engineering in RF CMOS', University of Twente, Enschede. https://doi.org/10.3990/1.9789036526906

    Reliability engineering in RF CMOS. / Sasse, G.T.

    Enschede : Ipskamp Printing, 2008. 132 p.

    Research output: ThesisPhD Thesis - Research UT, graduation UT

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    T1 - Reliability engineering in RF CMOS

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    AB - In this thesis new developments are presented for reliability engineering in RF CMOS. Given the increase in use of CMOS technology in applications for mobile communication, also the reliability of CMOS for such applications becomes increasingly important. When applied in these applications, CMOS is typically referred to as RF CMOS, where RF stands for radio frequencies.

    KW - SC-ICRY: Integrated Circuit Reliability and Yield

    KW - EWI-13183

    KW - IR-59032

    KW - METIS-251124

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    DO - 10.3990/1.9789036526906

    M3 - PhD Thesis - Research UT, graduation UT

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    CY - Enschede

    ER -

    Sasse GT. Reliability engineering in RF CMOS. Enschede: Ipskamp Printing, 2008. 132 p. https://doi.org/10.3990/1.9789036526906