Reliability modelling with respect to circuit applications

J.F. Verweij, A.J. Mouthaan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the 23rd European Solid State Device Research Conference
    Place of PublicationGrenoble, France
    Pages719-725
    Publication statusPublished - 13 Sep 1993

    Keywords

    • METIS-113995

    Cite this

    Verweij, J. F., & Mouthaan, A. J. (1993). Reliability modelling with respect to circuit applications. In Proceedings of the 23rd European Solid State Device Research Conference (pp. 719-725). Grenoble, France.
    Verweij, J.F. ; Mouthaan, A.J. / Reliability modelling with respect to circuit applications. Proceedings of the 23rd European Solid State Device Research Conference. Grenoble, France, 1993. pp. 719-725
    @inproceedings{0a6d5f0f7efa4718b3af1092cd198107,
    title = "Reliability modelling with respect to circuit applications",
    keywords = "METIS-113995",
    author = "J.F. Verweij and A.J. Mouthaan",
    year = "1993",
    month = "9",
    day = "13",
    language = "Undefined",
    pages = "719--725",
    booktitle = "Proceedings of the 23rd European Solid State Device Research Conference",

    }

    Verweij, JF & Mouthaan, AJ 1993, Reliability modelling with respect to circuit applications. in Proceedings of the 23rd European Solid State Device Research Conference. Grenoble, France, pp. 719-725.

    Reliability modelling with respect to circuit applications. / Verweij, J.F.; Mouthaan, A.J.

    Proceedings of the 23rd European Solid State Device Research Conference. Grenoble, France, 1993. p. 719-725.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Reliability modelling with respect to circuit applications

    AU - Verweij, J.F.

    AU - Mouthaan, A.J.

    PY - 1993/9/13

    Y1 - 1993/9/13

    KW - METIS-113995

    M3 - Conference contribution

    SP - 719

    EP - 725

    BT - Proceedings of the 23rd European Solid State Device Research Conference

    CY - Grenoble, France

    ER -

    Verweij JF, Mouthaan AJ. Reliability modelling with respect to circuit applications. In Proceedings of the 23rd European Solid State Device Research Conference. Grenoble, France. 1993. p. 719-725