Reliability modelling with respect to circuit applications

J.F. Verweij, A.J. Mouthaan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the 23rd European Solid State Device Research Conference
    Place of PublicationGrenoble, France
    Pages719-725
    Publication statusPublished - 13 Sep 1993

    Keywords

    • METIS-113995

    Cite this

    Verweij, J. F., & Mouthaan, A. J. (1993). Reliability modelling with respect to circuit applications. In Proceedings of the 23rd European Solid State Device Research Conference (pp. 719-725). Grenoble, France.