Reliability of SAR ADCs and associated embedded instrument detection

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which are mostly focussed on passive capacitor banks inside SAR ADCs. However the reliability of SAR ADCs is rarely reported, which is more related to the active circuit parts and is also essential for safe-critical applications. In this paper, the focus will be on the reliability effects and associated embedded instrument detection of a 10-bits SAR ADC in 65nm CMOS technology. The NBTI degradation in the bootstrapped switches, self-timing asynchronous SAR logics, input buffer and comparator inside a 10-bits SAR ADC are investigated as well as the overall performance degradation of the ADC. Finally, embedded instrument methods are proposed to detect these reliability influences in SAR ADCs.
Original languageUndefined
Title of host publication20th International Mixed-Signal Testing Workshop, IMSTW 2015
Place of PublicationFrance
PublisherIEEE Computer Society
Pages1-5
Number of pages5
ISBN (Print)978-1-4673-6732-5
DOIs
Publication statusPublished - 24 Jun 2015
Event2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015 - Paris, France
Duration: 24 Jun 201526 Jun 2015
Conference number: 20

Publication series

Name
PublisherIEEE Computer Society

Workshop

Workshop2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015
Abbreviated titleIMSTW
CountryFrance
CityParis
Period24/06/1526/06/15

Keywords

  • EWI-26293
  • METIS-312715
  • IR-97825
  • CAES-TDT: Testable Design and Test

Cite this

Wan, J., & Kerkhoff, H. G. (2015). Reliability of SAR ADCs and associated embedded instrument detection. In 20th International Mixed-Signal Testing Workshop, IMSTW 2015 (pp. 1-5). France: IEEE Computer Society. https://doi.org/10.1109/IMS3TW.2015.7177870
Wan, J. ; Kerkhoff, Hans G. / Reliability of SAR ADCs and associated embedded instrument detection. 20th International Mixed-Signal Testing Workshop, IMSTW 2015. France : IEEE Computer Society, 2015. pp. 1-5
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title = "Reliability of SAR ADCs and associated embedded instrument detection",
abstract = "Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which are mostly focussed on passive capacitor banks inside SAR ADCs. However the reliability of SAR ADCs is rarely reported, which is more related to the active circuit parts and is also essential for safe-critical applications. In this paper, the focus will be on the reliability effects and associated embedded instrument detection of a 10-bits SAR ADC in 65nm CMOS technology. The NBTI degradation in the bootstrapped switches, self-timing asynchronous SAR logics, input buffer and comparator inside a 10-bits SAR ADC are investigated as well as the overall performance degradation of the ADC. Finally, embedded instrument methods are proposed to detect these reliability influences in SAR ADCs.",
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Wan, J & Kerkhoff, HG 2015, Reliability of SAR ADCs and associated embedded instrument detection. in 20th International Mixed-Signal Testing Workshop, IMSTW 2015. IEEE Computer Society, France, pp. 1-5, 2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015, Paris, France, 24/06/15. https://doi.org/10.1109/IMS3TW.2015.7177870

Reliability of SAR ADCs and associated embedded instrument detection. / Wan, J.; Kerkhoff, Hans G.

20th International Mixed-Signal Testing Workshop, IMSTW 2015. France : IEEE Computer Society, 2015. p. 1-5.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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N2 - Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which are mostly focussed on passive capacitor banks inside SAR ADCs. However the reliability of SAR ADCs is rarely reported, which is more related to the active circuit parts and is also essential for safe-critical applications. In this paper, the focus will be on the reliability effects and associated embedded instrument detection of a 10-bits SAR ADC in 65nm CMOS technology. The NBTI degradation in the bootstrapped switches, self-timing asynchronous SAR logics, input buffer and comparator inside a 10-bits SAR ADC are investigated as well as the overall performance degradation of the ADC. Finally, embedded instrument methods are proposed to detect these reliability influences in SAR ADCs.

AB - Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which are mostly focussed on passive capacitor banks inside SAR ADCs. However the reliability of SAR ADCs is rarely reported, which is more related to the active circuit parts and is also essential for safe-critical applications. In this paper, the focus will be on the reliability effects and associated embedded instrument detection of a 10-bits SAR ADC in 65nm CMOS technology. The NBTI degradation in the bootstrapped switches, self-timing asynchronous SAR logics, input buffer and comparator inside a 10-bits SAR ADC are investigated as well as the overall performance degradation of the ADC. Finally, embedded instrument methods are proposed to detect these reliability influences in SAR ADCs.

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Wan J, Kerkhoff HG. Reliability of SAR ADCs and associated embedded instrument detection. In 20th International Mixed-Signal Testing Workshop, IMSTW 2015. France: IEEE Computer Society. 2015. p. 1-5 https://doi.org/10.1109/IMS3TW.2015.7177870