Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

R. Kassies, Kees van der Werf, Martin L. Bennink, Cornelis Otto

    Research output: Contribution to journalArticleAcademicpeer-review

    32 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)689-693
    Number of pages5
    JournalReview of scientific instruments
    Volume75
    Issue number3
    Publication statusPublished - 2004

    Keywords

    • METIS-219102

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