Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

R. Kassies, Kees van der Werf, Martin L. Bennink, Cornelis Otto

    Research output: Contribution to journalArticleAcademicpeer-review

    40 Citations (Scopus)
    2 Downloads (Pure)
    Original languageEnglish
    Pages (from-to)689-693
    Number of pages5
    JournalReview of scientific instruments
    Volume75
    Issue number3
    DOIs
    Publication statusPublished - 2004

    Keywords

    • 2020 OA procedure

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