| Original language | Undefined |
|---|---|
| Pages (from-to) | 689-693 |
| Number of pages | 5 |
| Journal | Review of scientific instruments |
| Volume | 75 |
| Issue number | 3 |
| Publication status | Published - 2004 |
Keywords
- METIS-219102
Cite this
Kassies, R., van der Werf, K., Bennink, M. L., & Otto, C. (2004). Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation. Review of scientific instruments, 75(3), 689-693.