Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

R. Kassies; Kees van der Werf; Martin L. Bennink; Cornelis Otto

doi:10.1063/1.1646767

Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

R. Kassies, Kees van der Werf, Martin L. Bennink, Cornelis Otto

Research output: Contribution to journal › Article › Academic › peer-review

40 Citations (Scopus)

2 Downloads (Pure)

Original language	English
Pages (from-to)	689-693
Number of pages	5
Journal	Review of scientific instruments
Volume	75
Issue number	3
DOIs	https://doi.org/10.1063/1.1646767
Publication status	Published - 2004

Keywords

2020 OA procedure

Access to Document

10.1063/1.1646767

ArticleFinal published version, 692 KBLicence: Taverne

Cite this

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title = "Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation",

keywords = "2020 OA procedure",

author = "R. Kassies and {van der Werf}, Kees and Bennink, {Martin L.} and Cornelis Otto",

year = "2004",

doi = "10.1063/1.1646767",

language = "English",

volume = "75",

pages = "689--693",

journal = "Review of scientific instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

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T1 - Removing Interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

AU - Kassies, R.

AU - van der Werf, Kees

AU - Bennink, Martin L.

AU - Otto, Cornelis

PY - 2004

Y1 - 2004

KW - 2020 OA procedure

U2 - 10.1063/1.1646767

DO - 10.1063/1.1646767

M3 - Article

SN - 0034-6748

VL - 75

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EP - 693

JO - Review of scientific instruments

JF - Review of scientific instruments

IS - 3

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