Reorientation in the magnetic anisotropy as a function of film thickness has been observed in Co-Ni and Co thin films, obliquely sputtered on a polyethylene terephthalate substrate at a large incidence angle (70°). This effect is a consequence of the low magnetocrystalline anisotropy of the films ~fcc structure of Co! and changes in microstructure from nuclei to columns according to the thickness. The critical thickness for this transition was estimated to be 30 nm for Co-Ni.
|Number of pages||5|
|Journal||Physical review B: Condensed matter and materials physics|
|Publication status||Published - 2002|
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS