Abstract
A means of accurate control of the curvature radius of molds that are used in nanostructure replication techniques is presented. The local non-uniform growth of SiO2 at regions with high curvature is used to fabricate molds with a curvature radius ranging anywhere between 10 and 250 nm. The mold radius is predicted by numerical simulation as a function of oxidation tempera-
ture and time and con
| Original language | English |
|---|---|
| Pages (from-to) | 55-59 |
| Number of pages | 5 |
| Journal | Journal of nanoscience and nanotechnology |
| Volume | 2 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Feb 2002 |
Keywords
- EWI-15577
- METIS-210018
- Soft Lithography
- IR-67752
- Nanoprobe
- Nanomold
- EPON SU-8
- Oxidation Sharpening
- Replication
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