Resistance Measurement Error Caused by Thermal Effects in a DC Circuit

N. Damean, Paulus P.L. Regtien, Z. Houkes

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa
    Place of PublicationTampere,Finland
    Publication statusPublished - 6 Jun 1997


    • METIS-113452

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