Resistance Measurement Error Caused by Thermal Effects in a DC Circuit

N. Damean, Paulus P.L. Regtien, Z. Houkes

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa
    Place of PublicationTampere,Finland
    Pages155-160
    Publication statusPublished - 6 Jun 1997

    Keywords

    • METIS-113452

    Cite this

    Damean, N., Regtien, P. P. L., & Houkes, Z. (1997). Resistance Measurement Error Caused by Thermal Effects in a DC Circuit. In Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa (pp. 155-160). Tampere,Finland.
    Damean, N. ; Regtien, Paulus P.L. ; Houkes, Z. / Resistance Measurement Error Caused by Thermal Effects in a DC Circuit. Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa. Tampere,Finland, 1997. pp. 155-160
    @inproceedings{9276765cb2ce43c8823ef25990a01617,
    title = "Resistance Measurement Error Caused by Thermal Effects in a DC Circuit",
    keywords = "METIS-113452",
    author = "N. Damean and Regtien, {Paulus P.L.} and Z. Houkes",
    year = "1997",
    month = "6",
    day = "6",
    language = "Undefined",
    isbn = "951-96042-8-6",
    pages = "155--160",
    booktitle = "Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa",

    }

    Damean, N, Regtien, PPL & Houkes, Z 1997, Resistance Measurement Error Caused by Thermal Effects in a DC Circuit. in Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa. Tampere,Finland, pp. 155-160.

    Resistance Measurement Error Caused by Thermal Effects in a DC Circuit. / Damean, N.; Regtien, Paulus P.L.; Houkes, Z.

    Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa. Tampere,Finland, 1997. p. 155-160.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Resistance Measurement Error Caused by Thermal Effects in a DC Circuit

    AU - Damean, N.

    AU - Regtien, Paulus P.L.

    AU - Houkes, Z.

    PY - 1997/6/6

    Y1 - 1997/6/6

    KW - METIS-113452

    M3 - Conference contribution

    SN - 951-96042-8-6

    SP - 155

    EP - 160

    BT - Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa

    CY - Tampere,Finland

    ER -

    Damean N, Regtien PPL, Houkes Z. Resistance Measurement Error Caused by Thermal Effects in a DC Circuit. In Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa. Tampere,Finland. 1997. p. 155-160