Resistance Measurement Error Caused by Thermal Effects in a DC Circuit

N. Damean, Paulus P.L. Regtien, Z. Houkes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa
Place of Publication	Tampere,Finland
Pages	155-160
Publication status	Published - 6 Jun 1997

Keywords

@inproceedings{9276765cb2ce43c8823ef25990a01617,

title = "Resistance Measurement Error Caused by Thermal Effects in a DC Circuit",

keywords = "METIS-113452",

author = "N. Damean and Regtien, {Paulus P.L.} and Z. Houkes",

year = "1997",

month = jun,

day = "6",

language = "Undefined",

isbn = "951-96042-8-6",

pages = "155--160",

booktitle = "Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa",

}

TY - GEN

T1 - Resistance Measurement Error Caused by Thermal Effects in a DC Circuit

AU - Damean, N.

AU - Regtien, Paulus P.L.

AU - Houkes, Z.

PY - 1997/6/6

Y1 - 1997/6/6

KW - METIS-113452

M3 - Conference contribution

SN - 951-96042-8-6

SP - 155

EP - 160

BT - Proceedings of the XIV Imeko World Congress,New Measurement-challenges and Visions, Volume IVa

CY - Tampere,Finland

ER -