Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates

Liesbeth Mulder, Daan Harm Wielens, Yorick A. Birkhölzer, A. Brinkman, Omar Concepcion Diaz*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

5 Downloads (Pure)

Abstract

Ultrathin films of the ternary topological insulator (Bi0.4Sb0.6)2Te3 are fabricated by molecular beam epitaxy. Although it is generally assumed that the ternary topological insulator tellurides grow by van der Waals epitaxy, our results show that the influence of the substrate is substantial and governs the formation of defects, mosaicity, and twin domains. For this comparative study, InP (111)A, Al2O3 (001), and SrTiO3 (111) substrates were selected. While the films deposited on lattice-matched InP (111)A show van der Waals epitaxial relations, our results point to a quasi-van der Waals epitaxy for the films grown on substrates with a larger lattice mismatch.
Original languageEnglish
Article number1790
JournalNanomaterials
Volume12
Issue number11
Early online date24 May 2022
DOIs
Publication statusPublished - 1 Jun 2022

Fingerprint

Dive into the research topics of 'Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates'. Together they form a unique fingerprint.

Cite this