RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties

J.C. Lodder; T. Wielinga; J. Worst

doi:10.1016/0040-6090(83)90493-5

RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties

J.C. Lodder, T. Wielinga, J. Worst

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Abstract

Co-Cr layers for the perpendicular recording mode were deposited by means of r.f. sputtering under suitable conditions in an argon plasma. The films were characterized structurally by X-ray and electron microscopy and the magnetic properties were determined with a vibrating sample magnetometer and by torque measurements.

Original language	English
Pages (from-to)	61-73
Number of pages	13
Journal	Thin solid films
Volume	101
Issue number	1
DOIs	https://doi.org/10.1016/0040-6090(83)90493-5
Publication status	Published - 1982

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS

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10.1016/0040-6090(83)90493-5

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title = "RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties",

abstract = "Co-Cr layers for the perpendicular recording mode were deposited by means of r.f. sputtering under suitable conditions in an argon plasma. The films were characterized structurally by X-ray and electron microscopy and the magnetic properties were determined with a vibrating sample magnetometer and by torque measurements.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",

author = "J.C. Lodder and T. Wielinga and J. Worst",

year = "1982",

doi = "10.1016/0040-6090(83)90493-5",

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T1 - RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties

AU - Lodder, J.C.

AU - Wielinga, T.

AU - Worst, J.

PY - 1982

Y1 - 1982

N2 - Co-Cr layers for the perpendicular recording mode were deposited by means of r.f. sputtering under suitable conditions in an argon plasma. The films were characterized structurally by X-ray and electron microscopy and the magnetic properties were determined with a vibrating sample magnetometer and by torque measurements.

AB - Co-Cr layers for the perpendicular recording mode were deposited by means of r.f. sputtering under suitable conditions in an argon plasma. The films were characterized structurally by X-ray and electron microscopy and the magnetic properties were determined with a vibrating sample magnetometer and by torque measurements.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1016/0040-6090(83)90493-5

DO - 10.1016/0040-6090(83)90493-5

M3 - Article

SN - 0040-6090

VL - 101

SP - 61

EP - 73

JO - Thin solid films

JF - Thin solid films

IS - 1

ER -

RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties

Abstract

Keywords

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