RF-sputtered Co-Cr layers for perpendicular magnetic recording. 1.Structural properties

J.C. Lodder, T. Wielinga, J. Worst

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    Abstract

    Co-Cr layers for the perpendicular recording mode were deposited by means of r.f. sputtering under suitable conditions in an argon plasma. The films were characterized structurally by X-ray and electron microscopy and the magnetic properties were determined with a vibrating sample magnetometer and by torque measurements.
    Original languageUndefined
    Pages (from-to)61-73
    Number of pages13
    JournalThin solid films
    Volume101
    Issue number1
    DOIs
    Publication statusPublished - 1982

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • IR-66133
    • SMI-MAT: MATERIALS
    • EWI-5575

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