R.F.-sputtered Co-Cr layers for perpendicular magnetic recording: Magnetic anisotropy

J. Worst; J.C. Lodder; T. Wielinga

doi:10.1016/0040-6090(83)90494-7

R.F.-sputtered Co-Cr layers for perpendicular magnetic recording: Magnetic anisotropy

J. Worst, J.C. Lodder, T. Wielinga

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Abstract

The magnetic anisotropy of Co-Cr layers was investigated with a torque magnetometer, using Fourier analysis. The results could be fitted to the hexagonal anisotropy, described by a first-order and a second-order uniaxial anisotropy constant. The second-order uniaxial anisotropy constant K2 was 2%-4% of the first-order anisotropy constant K1. Higher order anisotropy constants were not significant. The magnetic anisotropy and the saturation magnetization appeared to be almost independent of the layer thickness. Magnetostriction was found to give a negative contriburion to the first-order anisotropy constant.

Original language	Undefined
Pages (from-to)	75-81
Number of pages	7
Journal	Thin solid films
Volume	101
DOIs	https://doi.org/10.1016/0040-6090(83)90494-7
Publication status	Published - 1983

Keywords

SMI-TST: From 2006 in EWI-TST
IR-66160
SMI-MAT: MATERIALS
EWI-5668

Access to Document

10.1016/0040-6090(83)90494-7

WORST1983
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WORST1983
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Cite this

@article{1349ea45ec414e4982978770c8db8592,

title = "R.F.-sputtered Co-Cr layers for perpendicular magnetic recording: Magnetic anisotropy",

abstract = "The magnetic anisotropy of Co-Cr layers was investigated with a torque magnetometer, using Fourier analysis. The results could be fitted to the hexagonal anisotropy, described by a first-order and a second-order uniaxial anisotropy constant. The second-order uniaxial anisotropy constant K2 was 2%-4% of the first-order anisotropy constant K1. Higher order anisotropy constants were not significant. The magnetic anisotropy and the saturation magnetization appeared to be almost independent of the layer thickness. Magnetostriction was found to give a negative contriburion to the first-order anisotropy constant.",

keywords = "SMI-TST: From 2006 in EWI-TST, IR-66160, SMI-MAT: MATERIALS, EWI-5668",

author = "J. Worst and J.C. Lodder and T. Wielinga",

note = "Imported from SMI Reference manager",

year = "1983",

doi = "10.1016/0040-6090(83)90494-7",

language = "Undefined",

volume = "101",

pages = "75--81",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

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TY - JOUR

T1 - R.F.-sputtered Co-Cr layers for perpendicular magnetic recording: Magnetic anisotropy

AU - Worst, J.

AU - Lodder, J.C.

AU - Wielinga, T.

N1 - Imported from SMI Reference manager

PY - 1983

Y1 - 1983

N2 - The magnetic anisotropy of Co-Cr layers was investigated with a torque magnetometer, using Fourier analysis. The results could be fitted to the hexagonal anisotropy, described by a first-order and a second-order uniaxial anisotropy constant. The second-order uniaxial anisotropy constant K2 was 2%-4% of the first-order anisotropy constant K1. Higher order anisotropy constants were not significant. The magnetic anisotropy and the saturation magnetization appeared to be almost independent of the layer thickness. Magnetostriction was found to give a negative contriburion to the first-order anisotropy constant.

AB - The magnetic anisotropy of Co-Cr layers was investigated with a torque magnetometer, using Fourier analysis. The results could be fitted to the hexagonal anisotropy, described by a first-order and a second-order uniaxial anisotropy constant. The second-order uniaxial anisotropy constant K2 was 2%-4% of the first-order anisotropy constant K1. Higher order anisotropy constants were not significant. The magnetic anisotropy and the saturation magnetization appeared to be almost independent of the layer thickness. Magnetostriction was found to give a negative contriburion to the first-order anisotropy constant.

KW - SMI-TST: From 2006 in EWI-TST

KW - IR-66160

KW - SMI-MAT: MATERIALS

KW - EWI-5668

U2 - 10.1016/0040-6090(83)90494-7

DO - 10.1016/0040-6090(83)90494-7

M3 - Article

VL - 101

SP - 75

EP - 81

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -