Rise-time effects in ggnMOSt under TLP stress

G. Boselli, A.J. Mouthaan, F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    4 Citations (Scopus)
    Original languageUndefined
    Title of host publicationMIEL International Microelectronics Reliability
    Place of PublicationNis, Yugoslavia
    Pages-
    Publication statusPublished - 1 May 1999

    Keywords

    • METIS-113912

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