Robust design (integrating reliabilityanalysis optimization in the design process of electronic circuits

D.C.L. van Geest, A.C. Brombacher, P.H. Fennema, O.E. Herrmann

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 1 Sep 1991
    EventSymposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991 - Veldhoven, The Netherlands
    Duration: 1 Sep 1991 → …

    Conference

    ConferenceSymposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991
    CityVeldhoven, The Netherlands
    Period1/09/91 → …

    Keywords

    • METIS-118031

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