Robust design (integrating reliabilityanalysis optimization in the design process of electronic circuits

D.C.L. van Geest, A.C. Brombacher, P.H. Fennema, O.E. Herrmann

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 1 Sept 1991
Event	Symposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991 - Veldhoven, The Netherlands Duration: 1 Sept 1991 → …

Conference	Symposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991
City	Veldhoven, The Netherlands
Period	1/09/91 → …

Keywords

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author = "\{van Geest\}, D.C.L. and A.C. Brombacher and P.H. Fennema and O.E. Herrmann",

year = "1991",

month = sep,

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note = "Symposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991 ; Conference date: 01-09-1991",

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Robust design (integrating reliabilityanalysis optimization in the design process of electronic circuits. / van Geest, D.C.L.; Brombacher, A.C.; Fennema, P.H. et al.
1991. - Poster session presented at Symposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991, Veldhoven, The Netherlands.

Research output: Contribution to conference › Poster › Other research output

TY - CONF

T1 - Robust design (integrating reliabilityanalysis optimization in the design process of electronic circuits

AU - van Geest, D.C.L.

AU - Brombacher, A.C.

AU - Fennema, P.H.

AU - Herrmann, O.E.

PY - 1991/9/1

Y1 - 1991/9/1

KW - METIS-118031

M3 - Poster

SP - -

T2 - Symposium Wetenschappelijke vergadering Halfgeleiders/IOP/ProRISCP 1991

Y2 - 1 September 1991

ER -